(EN)

MarSurf VD Series – The MarSurf family is complemented:

The easy change between roughness and contour tracing system

Depending on the measuring task, either the BFW roughness probe system for surface roughness or the C 11 contour probe system for contour measurements can be changed by the operator (hot-plug capable). The new system offers the advantages of combining the highly dynamic C 11 contour probe system with the high-precision BFW probe system, which is particularly suitable for fine surfaces.

The new measuring station concept combines speed, reliability and flexibility.
The aim is to increase the profitability of the system for your company.
The measuring stations are operated with the user-friendly MarWin software (MarWin Easy Roughness & Contour or MarWin Professional Roughness & Contour).

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Technical Data

Machine building

  • Bearings, threads, threaded rods, ball screws, shafts, racks

Measurement close to the production area

  • Contour measurement in semi-automated operation

Automotive industry

  • Steering, brake system, gearbox, crankshaft, camshaft, cylinder head

Medicine

  • Contour measurement for hip and knee endoprostheses
  • Contour measurement for medical screws
  • Contour measurement for dental implants

Applications

Optional:

  • Parallel vise, vee-block
  • Equipment table

Software options:

  • DXF import option
  • Tangential elements option
  • QS-STAT / QS-STAT Plus option

Accessories

  • MarSurf XC 2 including PC, MidRange Standard, MarSurf XC 2 software, Mahr license key
  • TFT monitor
  • MarSurf CD 120 drive unit
  • MarSurf ST 500 measuring stand (including holder)
  • Calibration set
  • MCP 23 manual control panel
  • CT 120 XY table including rotary adjustment

Versions

 

MarSurf CD 280
MarSurf CD 140
Resolution
max. 6 nm (with 210 mm probe arm)
max. 6 nm (with 210 mm probe arm)
Start of traversing length (in X)
0.1 mm
0.1 mm
Probe arm length
210 mm; 350 mm; 490 mm
210 mm; 350 mm; 490 mm
End of traversing length (in X)
280 mm
140 mm
Positioning speed
0.02 – 200 mm/s (in X)
0.02 – 200 mm/s (in X)
Guide deviation
0,35  µm  /   60 mm
0,4     µm / 140 mm
0,75     µm / 280 mm
0.35 µm / 60 mm
0.4 µm / 140 mm
Measuring speed
0.02 – 10 mm/s
0.02 – 10 mm/s
Measuring range mm
70 mm (in Z with 350 mm probe arm)
max. 100 mm (with 490 mm probe arm)
70 mm (in Z with 350 mm probe arm)
max. 100 mm (with 490 mm probe arm)
Measuring force (N)
4 mN to 30 mN, in Z+ and Z-, adjustable via software
4 mN to 30 mN, in Z+ and Z-, adjustable via software